发明名称 |
MEMORY DEVICE AND MEMORY SYSTEM HAVING THE SAME |
摘要 |
A memory device includes a power-up control circuit, first to n^th boosting voltage generators, first to n^th switches, and a memory block. The power-up control circuit sequentially first to n^th power-up signals when a power supply voltage is received in an early power-up stage. Each of the first to n^th boosting voltage generators generates an internal boosting voltage based on an external boosting voltage. The first to n^th switches are sequentially turned on in response to the first to n^th power-up signals to sequentially provide the external boosting voltage to the first to n^th boosting voltage generators. The memory block performs a reading operation and a writing operation based on the internal boosting voltage. The power-up control circuit sequentially activates the first to n^th power-up signals on a first cycle in response to an increase in the power supply voltage and, when a reset signal transits to a logical high level before the first to n^th power-up signals are all activated, changes an activation cycle of the first to n^th power-up signals to a second cycle shorter than the first cycle. Thus, the amount of current consumed during power-up can be temporarily dispersed. |
申请公布号 |
KR20160057619(A) |
申请公布日期 |
2016.05.24 |
申请号 |
KR20140158449 |
申请日期 |
2014.11.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SEUNG HUN;CHOI, HYUNG CHAN;SHIN, WON JAE |
分类号 |
G11C5/14;G11C5/06 |
主分类号 |
G11C5/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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