发明名称 PROBE DEVICE AND PROBE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a probe device capable of performing alignment of a pair of cameras in a short time by optical means, without using any mechanical target.SOLUTION: In a probe device, the projection optical section 67 of a lower imaging unit generates an optical target mark, when the light irradiated from a projection light source 81 passes through a target 65. The target mark is projected to an imaging position P and the imaging part 61a of a lower camera 61, by the light irradiated from the projection light source 81. Since the imaging part 91a of an upper camera 91 and the imaging position P are arranged at positions optically conjugate each other, a target mark imaged at the imaging position P is also projected to the imaging part 91a of an upper camera 91.SELECTED DRAWING: Figure 3
申请公布号 JP2016111175(A) 申请公布日期 2016.06.20
申请号 JP20140246670 申请日期 2014.12.05
申请人 TOKYO ELECTRON LTD;SEIWA OPTICAL CO LTD 发明人 TAMURA MUNEAKI;AKAIKE SHINJI;SAIKI KENTA;KOSHIMIZU KAZUHIKO;OKAZAKI ISAO;KAWATSUKI MITSUYA;TSUDA KIYOSHI
分类号 H01L21/66 主分类号 H01L21/66
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