发明名称 Sample hold circuit, A/D converter, calibration method of the sample hold circuit, and circuit
摘要 There is provided a pipelined A/D converter in which plural stages Stage 1 to Stage N each including an MDAC (i.e., Multiplying DA Converter) are connected. The pipelined A/D converter is configured with a Gain-AMP (12) included in the MDAC for the SPM, MOS transistors (Mx1) and (Mx2) as a differential pair having output ends connected to a sampling capacitor CsI on a subsequent stage, MOS transistors (My1) and (My2) as a load unit connected to the differential pair, a current source (I3) configured to supply a current to the MOS transistors (Mx1) and (Mx2) as the differential pair, and current sources (I1) and (I2) configured to adjust the current flown across the MOS transistors (My1) and (My2) as the load unit.
申请公布号 US9374104(B2) 申请公布日期 2016.06.21
申请号 US201314424111 申请日期 2013.08.12
申请人 Asahi Kasei Microdevices Corporation 发明人 Miyahara Yuichi
分类号 H03M1/12;H03M1/10;H03M1/06;H03M1/16;H03M1/44 主分类号 H03M1/12
代理机构 Morgan, Lewis & Bockius LLP 代理人 Morgan, Lewis & Bockius LLP
主权项 1. A sample hold circuit, comprising: a sampling capacitor; a first amplifier having an input end to which the sampling capacitor is connected; and a second amplifier connected to the first amplifier, wherein the second amplifier comprises: a differential pair; a load unit connected to the differential pair; and a variable current unit configured to supply a current to at least one of the differential pair or the load unit, and wherein in a holding phase, the second amplifier is configured to monitor a voltage at a summing point that is a connection point of the sampling capacitor at the input end of the first amplifier.
地址 Tokyo JP