发明名称 POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a polishing device with short polishing time.SOLUTION: The polishing device according one an embodiment includes: a stage for retaining a wafer; a polishing part for polishing a membrane formed on a peripheral edge of the wafer; a detection part for detecting a residual part of the membrane on the peripheral edge; a first movable part for moving the detection part along a surface of the peripheral edge; and a control part for controlling the polishing part on the basis of a state of the peripheral edge detected by the detection part.SELECTED DRAWING: Figure 1
申请公布号 JP2016163042(A) 申请公布日期 2016.09.05
申请号 JP20150239626 申请日期 2015.12.08
申请人 TOSHIBA CORP 发明人 ADACHI MASAYOSHI;TAKAYASU ATSUSHI
分类号 H01L21/304;B24B21/00;B24B21/18 主分类号 H01L21/304
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