发明名称 SPECIMEN INSPECTION APPARATUS
摘要 A specimen inspection apparatus into which a specimen transporting apparatus is inserted, the specimen inspection apparatus including: a platform including an upper plate and a lower plate disposed to face each other and to be spaced apart from each other by a predetermined distance; an injection part provided in the upper plate, a front end of the specimen transporting apparatus being inserted into the injection part; an introduction part connected to the injection part and provided between the upper and lower plate; and a plurality of stepped parts provided in the introduction part.
申请公布号 WO2016153138(A1) 申请公布日期 2016.09.29
申请号 WO2015KR10966 申请日期 2015.10.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, Young-goun;MIN, Jung-ki;LEE, Jong-gun;JUNG, Hyun-ju
分类号 B01L3/02 主分类号 B01L3/02
代理机构 代理人
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