发明名称 Temperature compensated reverse current for memory
摘要 One aspect of the technology is a memory device comprising a memory array, a sense circuit, and temperature compensated bias circuitry. The memory array is electrically coupled between a bit line bias circuit and a common source line. The bit line bias circuit generates a temperature compensated sense current through the memory array. The temperature compensated bias circuitry controls the bit line bias circuit to generate the temperature compensated sense current through the memory array.
申请公布号 US9508446(B1) 申请公布日期 2016.11.29
申请号 US201514749460 申请日期 2015.06.24
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 Chen Chung-Kuang;Lai Yi-Ting
分类号 G11C16/04;G11C16/28;G11C7/04;G11C7/12 主分类号 G11C16/04
代理机构 Haynes Beffel & Wolfeld LLP 代理人 Haynes Beffel & Wolfeld LLP
主权项 1. A memory device, comprising: a memory array including a bit line and a source line, memory cells in the array electrically coupled between the bit line and the source line; a source line bias circuit connected to the source line to apply a voltage higher than a voltage on the bit line in a read operation; a bit line bias circuit connected to the bit line, generating a temperature compensated sense current for the read operation on the bit line through a selected memory cell from the source line; temperature compensated bias circuitry which provides a temperature dependent voltage to the bit line bias circuit to offset variations in current on the bit line due to temperature; and a sense amplifier coupled to the bit line.
地址 Hsinchu TW