发明名称 |
Temperature compensated reverse current for memory |
摘要 |
One aspect of the technology is a memory device comprising a memory array, a sense circuit, and temperature compensated bias circuitry. The memory array is electrically coupled between a bit line bias circuit and a common source line. The bit line bias circuit generates a temperature compensated sense current through the memory array. The temperature compensated bias circuitry controls the bit line bias circuit to generate the temperature compensated sense current through the memory array. |
申请公布号 |
US9508446(B1) |
申请公布日期 |
2016.11.29 |
申请号 |
US201514749460 |
申请日期 |
2015.06.24 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
Chen Chung-Kuang;Lai Yi-Ting |
分类号 |
G11C16/04;G11C16/28;G11C7/04;G11C7/12 |
主分类号 |
G11C16/04 |
代理机构 |
Haynes Beffel & Wolfeld LLP |
代理人 |
Haynes Beffel & Wolfeld LLP |
主权项 |
1. A memory device, comprising:
a memory array including a bit line and a source line, memory cells in the array electrically coupled between the bit line and the source line; a source line bias circuit connected to the source line to apply a voltage higher than a voltage on the bit line in a read operation; a bit line bias circuit connected to the bit line, generating a temperature compensated sense current for the read operation on the bit line through a selected memory cell from the source line; temperature compensated bias circuitry which provides a temperature dependent voltage to the bit line bias circuit to offset variations in current on the bit line due to temperature; and a sense amplifier coupled to the bit line. |
地址 |
Hsinchu TW |