发明名称 METHOD FOR FORMING PATTERN ONTO PHOTORESIST, HOLOGRAM THEREFOR, HOLOGRAM RECORDING SYSTEM AND APPLICATION TO MICROCHIP SCREEN OR ELECTRONIC SOURCE
摘要 <p>PROBLEM TO BE SOLVED: To provide a simplified method for forming a pattern onto photoresist. SOLUTION: This concerns a method for forming holes in photoresist 22, wherein a hologram image 138 of a single micro-spherical layer is formed by irradiating the single micro-spherical layer with vertical light beams while having parallel beams. Thus, a three-dimensional(3D) hologram recording image of the single layer and of a beam flux converged near the micro-spherical image is acquired and a 3D hologram image 144 of the beam flux is located within the thickness of the photoresist 22. Thus, an area of the photoresist 22 is exposed and developed, thus a pattern is formed in the above exposed area.</p>
申请公布号 JPH11231763(A) 申请公布日期 1999.08.27
申请号 JP19980331676 申请日期 1998.11.20
申请人 COMMISS ENERG ATOM 发明人 IDA MICHEL;GEFFRAYE FRANCOISE
分类号 G03H1/04;G03F7/00;G03F7/20;G03H1/22;H01J9/02;(IPC1-7):G03H1/04 主分类号 G03H1/04
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