发明名称 EXPOSURE EQUIPMENT AND EXPOSURE METHOD WITH REDUCED THERMAL DEFORMATION OF RETICLE
摘要 <P>PROBLEM TO BE SOLVED: To provide exposure equipment preventing thermal deformation of a reticle, and an exposure method using the equipment. <P>SOLUTION: The exposure equipment includes a reticle library 110 having a plurality of slots, a reticle stage 130 on which an exposure process proceeds, wherein a reticle is transferred to a reticle storage member 110 having a plurality of slots, then the reticle is transferred from one of the plurality of slots to the reticle stage 130 while the one of the plurality of slots is controlled at a saturation temperature of the reticle. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006319340(A) 申请公布日期 2006.11.24
申请号 JP20060131969 申请日期 2006.05.10
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 WON YOO-KEUN
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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