发明名称 |
POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a positive resist composition and a resist pattern forming method having fewer defects and superior in lithographic characteristics. <P>SOLUTION: The positive resist composition includes a resin component (A) having on a main chain a constituent unit derived from an (α-lower alkyl) acrylic acid ester having increased alkali solubility by the action of an acid and acid generating component (B) generating the acid by the irradiation with radiation. The resin component (A) is a copolymer having at least two constituent units obtained by the presence of the acid when manufactured by polymerizing at least one kind of monomer. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006317553(A) |
申请公布日期 |
2006.11.24 |
申请号 |
JP20050137777 |
申请日期 |
2005.05.10 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
MUROI MASAAKI;ATSUJI KOTA;NAKAMURA TAKAHIRO;YAMADA MASAKAZU;SAISHO KENSUKE;TAKESHITA MASARU;YAMAGISHI TAKANORI;OIKAWA SATORU |
分类号 |
G03F7/039;C08F220/28;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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