发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition and a resist pattern forming method having fewer defects and superior in lithographic characteristics. <P>SOLUTION: The positive resist composition includes a resin component (A) having on a main chain a constituent unit derived from an (&alpha;-lower alkyl) acrylic acid ester having increased alkali solubility by the action of an acid and acid generating component (B) generating the acid by the irradiation with radiation. The resin component (A) is a copolymer having at least two constituent units obtained by the presence of the acid when manufactured by polymerizing at least one kind of monomer. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006317553(A) 申请公布日期 2006.11.24
申请号 JP20050137777 申请日期 2005.05.10
申请人 TOKYO OHKA KOGYO CO LTD 发明人 MUROI MASAAKI;ATSUJI KOTA;NAKAMURA TAKAHIRO;YAMADA MASAKAZU;SAISHO KENSUKE;TAKESHITA MASARU;YAMAGISHI TAKANORI;OIKAWA SATORU
分类号 G03F7/039;C08F220/28;H01L21/027 主分类号 G03F7/039
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