发明名称 GATE STACK STRUCTURE WITH OXYGEN GETTERING LAYER
摘要 A transistor has a channel region in a substrate and source and drain regions in the substrate on opposite sides of the channel region. A gate stack is formed on the substrate above the channel region. This gate stack comprises an interface layer contacting the channel region of the substrate, and a high-k dielectric layer (having a dielectric constant above 4.0) contacting (on) the interface layer. A Nitrogen rich first metal Nitride layer contacts (is on) the dielectric layer, and a metal rich second metal Nitride layer contacts (is on) the first metal Nitride layer. Finally, a Polysilicon cap contacts (is on) the second metal Nitride layer.
申请公布号 US2009152651(A1) 申请公布日期 2009.06.18
申请号 US20070958595 申请日期 2007.12.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;AMD 发明人 BU HUIMING;CARTER RICK;CHUDZIK MICHAEL P.;GRAVES TROY L.;GRIBELYUK MICHAEL A.;JHA RASHMI;NARAYANAN VIJAY;PARK DAE-GYU;PARUCHURI VAMSI K.;YAN HONGWEN;DORIS BRUCE B.;WONG KEITH KWONG HON
分类号 H01L29/78 主分类号 H01L29/78
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