发明名称 Display device
摘要 A display device including a display area and a non-display area surrounding the display area. The non-display area includes a test data line (TDL) which receives a test data signal from an external source, a plurality of connection line units (CLUs) which connect the data lines and the TDL, and a dummy line unit which is formed in the non-display area. Each of the CLUs includes a test switch having an input terminal connected to the TDL, an output terminal connected to one of a plurality of data lines disposed in the display area, and a control terminal connected to a test switch control line which receives a test switch control signal from an external source. At least one of the CLUs includes a disconnection portion which interrupts the TDL, wherein both ends of the disconnection portion are connected to the dummy line unit by bypass connection lines, respectively.
申请公布号 US9495903(B2) 申请公布日期 2016.11.15
申请号 US201514678612 申请日期 2015.04.03
申请人 Samsung Display Co., Ltd. 发明人 Kwon Tae Hoon;Park Kyoung Jin;Byun Min Woo
分类号 G09G3/30;G09G3/32 主分类号 G09G3/30
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A display device comprising: a display area comprising a plurality of pixels formed at intersections of a plurality of data lines and a plurality of gate lines; a non-display area surrounding the display area, wherein: the non-display area comprises: a test data line configured to receive a test data signal from an external source;a plurality of connection line units connecting the data lines and the test data line; anda dummy line unit formed in at least a region of the non-display area; each of the connection line units comprises: a test switch comprising an input terminal connected to the test data line; anoutput terminal connected to one of the data lines; anda control terminal connected to a test switch control line and configured to receive a test switch control signal from an external source; at least one of the connection line units comprises a disconnection portion configured to interrupt the test data line; and both ends of the disconnection portion are connected to the dummy line unit by bypass connection lines, respectively.
地址 Yongin-si KR