发明名称 |
Display device |
摘要 |
A display device including a display area and a non-display area surrounding the display area. The non-display area includes a test data line (TDL) which receives a test data signal from an external source, a plurality of connection line units (CLUs) which connect the data lines and the TDL, and a dummy line unit which is formed in the non-display area. Each of the CLUs includes a test switch having an input terminal connected to the TDL, an output terminal connected to one of a plurality of data lines disposed in the display area, and a control terminal connected to a test switch control line which receives a test switch control signal from an external source. At least one of the CLUs includes a disconnection portion which interrupts the TDL, wherein both ends of the disconnection portion are connected to the dummy line unit by bypass connection lines, respectively. |
申请公布号 |
US9495903(B2) |
申请公布日期 |
2016.11.15 |
申请号 |
US201514678612 |
申请日期 |
2015.04.03 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Kwon Tae Hoon;Park Kyoung Jin;Byun Min Woo |
分类号 |
G09G3/30;G09G3/32 |
主分类号 |
G09G3/30 |
代理机构 |
H.C. Park & Associates, PLC |
代理人 |
H.C. Park & Associates, PLC |
主权项 |
1. A display device comprising:
a display area comprising a plurality of pixels formed at intersections of a plurality of data lines and a plurality of gate lines; a non-display area surrounding the display area, wherein: the non-display area comprises:
a test data line configured to receive a test data signal from an external source;a plurality of connection line units connecting the data lines and the test data line; anda dummy line unit formed in at least a region of the non-display area; each of the connection line units comprises:
a test switch comprising an input terminal connected to the test data line; anoutput terminal connected to one of the data lines; anda control terminal connected to a test switch control line and configured to receive a test switch control signal from an external source; at least one of the connection line units comprises a disconnection portion configured to interrupt the test data line; and both ends of the disconnection portion are connected to the dummy line unit by bypass connection lines, respectively. |
地址 |
Yongin-si KR |