发明名称 MANUFACTURE OF THIN-FILM SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To achieve uniform crystallization, and to increase the diameter of a particle in a semiconductor thin film that turns into the active layer of a thin-film transistor which is integrated and formed in a thin-film semiconductor device. SOLUTION: To manufacture a thin-film semiconductor device, first a film formation process is made, and a non-single crystal semiconductor thin film 2 is formed on the surface of an insulating board 1. Then, annealing is performed, and it is subjected to laser beam 50 irradiation, the non-single crystal semiconductor thin film 2 is heated and melted once for conversion into a polycrystal in a cooling process. After this, machining is carried out, with the polycrystalline semiconductor thin film 2 as an active layer, a thin-film transistor is integrated and formed. To make uniform crystallization and to obtain large particle diameter in annealing, a laser oscillator 51 including an excimer laser beam source is used, and a laser beam 50 with a pulse width of 50 ns or larger is shaped by an optical system 53, so that each side of a rectangular section is set to 10 mm or more for successively subjecting the semiconductor thin film 2 to the laser beam irradiation.
申请公布号 JP2000183358(A) 申请公布日期 2000.06.30
申请号 JP19980366277 申请日期 1998.12.24
申请人 SONY CORP 发明人 MINEGISHI MASAHIRO;SHIMOGAICHI YASUSHI;TAKATOKU MASATO;HAYASHI HISAO
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
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