发明名称 ADAPTER FOR MICROSCOPIC OBSERVATION, MICROSCOPIC OBSERVATION METHOD, AND MICROSCOPE APPARATUS
摘要 PROBLEM TO BE SOLVED: To shorten the time required for examination by making a minute examination object part which is indistinguishable by only a brightness contrast image, distinguishable even in a low magnification. SOLUTION: The adapter 1 for microscopic observation is disposed between a branch point 11 between illuminating light L<SB>1</SB>and reflected light L<SB>2</SB>of the microscope 8, and an examination object and is constituted by putting two quarter-wave plates 5 and 6 one over the other in a thickness direction and is rotatable about an optical axis, wherein the microscope 8 radiates a linearly polarized light component in a first direction A of the illuminating light L<SB>1</SB>from a light source 9, to the examination object 12 and branches the reflected light L<SB>2</SB>from the examination object 12 from the illuminating light L<SB>1</SB>and observes a linearly polarized light component in a second direction orthogonal to the first direction A, out of the branched reflected light L<SB>2</SB>. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007102115(A) 申请公布日期 2007.04.19
申请号 JP20050295475 申请日期 2005.10.07
申请人 OLYMPUS CORP 发明人 TANAKA TAKAAKI
分类号 G02B21/06 主分类号 G02B21/06
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