发明名称 |
A device for analyzing a transient waveform |
摘要 |
<p>A device for analyzing a transient waveform is provided with a computation unit which analyzes the observed transient response waveform as an input adaptive type autoregressive model consisting of a linear function of regressive coefficients dependent upon material parameters or upon material parameters and material spectra. It can perform a rapid and accurate analysis of the transient response waveform observed through the incidence of pulse laser beams, promoting searches into the prime process of material changes.</p> |
申请公布号 |
EP0420611(B1) |
申请公布日期 |
1995.12.20 |
申请号 |
EP19900310533 |
申请日期 |
1990.09.26 |
申请人 |
RESEARCH DEVELOPMENT CORPORATION OF JAPAN |
发明人 |
SASAKI, KEIJI, 14-20-405, SHOAZA-TORIIMAE |
分类号 |
G06F17/40;(IPC1-7):G06F17/40 |
主分类号 |
G06F17/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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