发明名称 A device for analyzing a transient waveform
摘要 <p>A device for analyzing a transient waveform is provided with a computation unit which analyzes the observed transient response waveform as an input adaptive type autoregressive model consisting of a linear function of regressive coefficients dependent upon material parameters or upon material parameters and material spectra. It can perform a rapid and accurate analysis of the transient response waveform observed through the incidence of pulse laser beams, promoting searches into the prime process of material changes.</p>
申请公布号 EP0420611(B1) 申请公布日期 1995.12.20
申请号 EP19900310533 申请日期 1990.09.26
申请人 RESEARCH DEVELOPMENT CORPORATION OF JAPAN 发明人 SASAKI, KEIJI, 14-20-405, SHOAZA-TORIIMAE
分类号 G06F17/40;(IPC1-7):G06F17/40 主分类号 G06F17/40
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