| 摘要 |
PROBLEM TO BE SOLVED: To remove a useless test pattern at the time of selecting test pattern for executing an IDDQ test. SOLUTION: A test pattern is read out (S1), logical simulation is executed (S2), IDDQ fault detection for checking whether a fault can be newly detected in a test pattern step or not, is checked (S3), and whether the IDDQ fault detection satisfies a pattern selection reference or not, is checked (S4). When new fault detection satisfying the pattern selection reference exists, the pattern is selected (S6). Then, a fault detection table in each step of the selected test pattern is checked, whether a set of detected faults in a newly selected test pattern step includes a set of faults detected only by the selected test pattern or not, is checked, and at the time of YES, the fault set is deleted from a test pattern selection list to optimize the list. |
