发明名称 |
SELF-EXAMINING METHOD OF COOKING STATE FOR MICROWAVE OVEN |
摘要 |
PURPOSE: A self-examining method of the cooking state for a microwave oven is provided to automatically judge the cooking state by detecting the cooking temperature of a certain time and to indicate the state. CONSTITUTION: The self-examining method of the cooking state for a microwave oven contains the steps of:inputting the cooking starting command after setting up the cooking temperature, the cooking time and the temperature variable; driving a magnetron during a certain time after detecting the early cooking temperature(T1) in a state of inputting the cooking starting command; detecting the current cooking temperature(T2) after passing a specific time and comparing the current cooking temperature(T2) with the early cooking temperature(T1) adding the temperature variable; and stopping the magnetron and indicating the error if judged the current cooking temperature(T2) is lower than the early cooking temperature(T1) adding the temperature variable.
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申请公布号 |
KR20000009831(A) |
申请公布日期 |
2000.02.15 |
申请号 |
KR19980030473 |
申请日期 |
1998.07.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, WON WOO |
分类号 |
F24C7/02;(IPC1-7):F24C7/02 |
主分类号 |
F24C7/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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