发明名称 SELF-EXAMINING METHOD OF COOKING STATE FOR MICROWAVE OVEN
摘要 PURPOSE: A self-examining method of the cooking state for a microwave oven is provided to automatically judge the cooking state by detecting the cooking temperature of a certain time and to indicate the state. CONSTITUTION: The self-examining method of the cooking state for a microwave oven contains the steps of:inputting the cooking starting command after setting up the cooking temperature, the cooking time and the temperature variable; driving a magnetron during a certain time after detecting the early cooking temperature(T1) in a state of inputting the cooking starting command; detecting the current cooking temperature(T2) after passing a specific time and comparing the current cooking temperature(T2) with the early cooking temperature(T1) adding the temperature variable; and stopping the magnetron and indicating the error if judged the current cooking temperature(T2) is lower than the early cooking temperature(T1) adding the temperature variable.
申请公布号 KR20000009831(A) 申请公布日期 2000.02.15
申请号 KR19980030473 申请日期 1998.07.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, WON WOO
分类号 F24C7/02;(IPC1-7):F24C7/02 主分类号 F24C7/02
代理机构 代理人
主权项
地址