发明名称 |
THIN FILM TRANSISTOR AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin film transistor which uses a zinc oxynitride layer as a channel and has intended characteristics.SOLUTION: A thin film transistor comprises a gate electrode 20, a first oxide semiconductor layer 41 used as a channel, a second oxide semiconductor layer 42 arranged on the first oxide semiconductor layer 41 and a gate insulation layer 30 arranged between the gate electrode 20 and the first oxide semiconductor layer 41. The first oxide semiconductor layer 41 and the second oxide semiconductor layer 42 contain zinc oxynitride as a major ingredient. The second oxide semiconductor layer 42 has an etching rate by an oxalic acid etchant smaller than that of the first oxide semiconductor layer 41.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016092148(A) |
申请公布日期 |
2016.05.23 |
申请号 |
JP20140223591 |
申请日期 |
2014.10.31 |
申请人 |
JOLED INC |
发明人 |
HARADA TAKESHI;TAKEDA EIJI;KAWASHIMA TAKAHIRO |
分类号 |
H01L21/336;C23C14/08;C23C14/34;H01L21/306;H01L21/363;H01L21/365;H01L29/786;H01L51/50 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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