发明名称 Electrostatic chuck and semiconductor manufacturing device
摘要 An electrostatic chuck includes a placing stage formed from a ceramic including aluminum oxide and yttrium oxide, and an electrostatic electrode arranged in the placing stage, wherein a content rate of the yttrium oxide is 0.5 wt % to 2.0 wt %. Preferably, the electrostatic chuck is used while being heated at a temperature of 100° C. to 200° C.
申请公布号 US9418884(B2) 申请公布日期 2016.08.16
申请号 US201414247603 申请日期 2014.04.08
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 Miyazawa Masakuni;Miyamoto Kazuyoshi
分类号 H01L21/683;H01L21/687 主分类号 H01L21/683
代理机构 Katz, Quintos & Hanson, LLP 代理人 Katz, Quintos & Hanson, LLP
主权项 1. An electrostatic chuck, comprising: a placing stage formed from a ceramic including aluminum oxide and yttrium oxide; and an electrostatic electrode arranged in the placing stage, wherein a content rate of the aluminum oxide is 94.2 wt % to 96.1 wt %, and a content rate of the yttrium oxide is 0.5 wt % to 2.0 wt %.
地址 Nagano-shi JP