发明名称 SEMICONDUCTOR DEVICE
摘要 Provided is a semiconductor device, including: an enable generating circuit (10) for generating an enable signal, being a pulse train in synchronization with a clock signal, and supplying the enable signal to a protection target circuit (30); and a first abnormality detecting circuit (20) for detecting an abnormality of clock timing due to introduction of a spike into the clock signal based on comparison between the clock signal and the enable signal generated by the enable generating circuit. Thus, a semiconductor device capable of detecting a local clock abnormality is obtained.
申请公布号 US2016253524(A1) 申请公布日期 2016.09.01
申请号 US201314898876 申请日期 2013.07.16
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 SUGAWARA Takeshi
分类号 G06F21/76;G06F21/10;G06F21/44;G06F21/56 主分类号 G06F21/76
代理机构 代理人
主权项
地址 Tokyo JP