发明名称 SOLID-STATE IMAGING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a solid-state imaging apparatus which utilizes infrared light from a medium-infrared region to a far-infrared region, improves a material discrimination performance and is capable of acquiring image information.SOLUTION: A solid-state imaging apparatus 1 comprises a light source 2 that irradiates a subject with infrared light, an image forming optical member 3, an infrared detection element 4 and a wavelength transmission filter array 5. In the infrared detection element, a plurality of pixels having sensitivities in a wavelength band to be detected are arranged in a two-dimensional array shape. The wavelength transmission filter array 5 is disposed between the image forming optical member 3 and the infrared detection element 4 and proximately to the infrared detection element 4, and a plurality of wavelength transmission filters 5 of which the wavelength bands to be transmitted are different in a wavelength band to be transmitted are arrayed on a plane.SELECTED DRAWING: Figure 1
申请公布号 JP2016163125(A) 申请公布日期 2016.09.05
申请号 JP20150038387 申请日期 2015.02.27
申请人 TOSHIBA CORP 发明人 UENO RISAKO;ISHII KOICHI;SUZUKI KAZUHIRO;FUNAKI HIDEYUKI
分类号 H04N5/33;G01N21/27;G01N21/35;H01L27/14;H01L27/144;H04N5/369 主分类号 H04N5/33
代理机构 代理人
主权项
地址