| 摘要 |
Provided is a test device for a lamp module which can control a location according to each component and analyze a change of a beam pattern and an influence degree of a light distribution rule when a light source finely rotates. According to an embodiment of the present invention, the test device of the lamp module is configured to enable a first support member to rotate a light source module, wherein the first support member is coupled to a first moving unit to support the light source module. |
