发明名称 |
Ceramic board for apparatuses for semiconductor manufacture and inspection |
摘要 |
The present invention has for its object to inhibit decrease in Young's modulus at high temperature without compromise in various other characteristics such as heat conductivity.The present invention is directed to a ceramic board for semiconductor manufacture and inspection comprising a conductor layer internally or on the surface thereof which is composed of nitride ceramics containing oxygen and 0.1 to 50 ppm (wt.) of Si.
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申请公布号 |
US6475606(B2) |
申请公布日期 |
2002.11.05 |
申请号 |
US20010765361 |
申请日期 |
2001.01.22 |
申请人 |
IBIDEN CO., LTD. |
发明人 |
NIWA TAKEO |
分类号 |
C04B35/581;C04B35/58;C04B41/51;C04B41/88;H01L21/324;H01L21/66;H01L21/683;H05B3/10;H05K1/03;(IPC1-7):B32B3/00;H05B3/02 |
主分类号 |
C04B35/581 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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