发明名称 SEMICONDUCTOR DEVICES HAVING ELONGATED CONTACT PLUGS
摘要 A method of manufacturing a semiconductor device includes forming conductive structures on a substrate. Each of the conductive structures has a line shape that extends along a first direction parallel to the substrate. Insulating spacers are formed on upper sidewalls of the conductive structures. An insulating interlayer is formed that covers the conductive structures. A portion of the insulating interlayer between the conductive structures is etched to form a contact hole. An upper portion of the contact hole is larger than a lower portion thereof. The upper portion of the contact hole has a first width along the first direction and a second width along a second direction parallel to the substrate and substantially perpendicular to the first direction. The first width is substantially larger than the second width. The contact hole is filled with a conductive material to form a contact plug.
申请公布号 US2008088025(A1) 申请公布日期 2008.04.17
申请号 US20070954349 申请日期 2007.12.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN CHEOL-JU;CHUNG TAE-YOUNG;LEE DONG-JUN
分类号 H01L23/48;H01L27/108;H01L21/60;H01L21/768;H01L21/8242;H01L29/12 主分类号 H01L23/48
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