发明名称 PLANAR SPECTROSCOPIC INTERFEROMETER
摘要 PROBLEM TO BE SOLVED: To allow a device of a simple configuration to quickly acquire an observation result by an interferometer and an observation result by a spectrometer in the same observation area.SOLUTION: A planar spectroscopic interferometer 100 is configured to arrange an interference measurement unit 20A and a spectroscopic measurement unit 20B on an irradiation optical axis O of a measured object S. The interference measurement unit 20A and the spectroscopic measurement unit 20B are configured to simultaneously observe the measured object S. Surface shape information processing means 31 is configured to acquire a three-dimensional distribution image 55 by an image from an interference detector 5, and spectroscopic information processing means 32 is configured to acquire a spectroscopic information image 56 by an image from a spectroscopic detector 13. Display control means 34 is configured to comprise three-dimensional information storage means 35, spectroscopic information storage means 36, three-dimensional display means 37, and spectroscopic information display means 38. Only specification of one point of the three-dimensional distribution image 55 displayed on display means 40 by input means 50 allows the spectroscopic information image 56 at a coordinate to be quickly and simply acquired and displayed.SELECTED DRAWING: Figure 1
申请公布号 JP2016118464(A) 申请公布日期 2016.06.30
申请号 JP20140258248 申请日期 2014.12.22
申请人 TOPCON TECHNOHOUSE CORP 发明人 AKIYAMA HISASHI
分类号 G01J3/45;G01B9/02 主分类号 G01J3/45
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