发明名称 |
Clock monitor and system on chip including the same |
摘要 |
A system on chip includes a plurality of function blocks configured to perform predetermined functions, respectively, a clock control unit configured to generate a plurality of operating clock signals that are provided to the plurality of function blocks, respectively, a clock monitor configured to monitor frequencies of the operating clock signals to generate an interrupt signal, and a processor configured to control the frequencies of the operating clock signals based on the interrupt signal. The clock monitor includes a selector configured to select one of the operating clock signals to provide a selected clock signal, a frequency detector configured to detect a frequency of the selected clock signal to provide a detection frequency, and an interrupt generator configured to generate the interrupt signal based on the detection frequency, where the interrupt signal indicates a frequency abnormality of the operating clock signal corresponding to the selected clock signal. |
申请公布号 |
US9391615(B2) |
申请公布日期 |
2016.07.12 |
申请号 |
US201514692771 |
申请日期 |
2015.04.22 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Shin Dong-Suk;Ahn Ji-Yong;Lee Jang-Hyeon |
分类号 |
G01R23/02;H03K19/00;H03K5/19;H03L7/18 |
主分类号 |
G01R23/02 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A clock monitor comprising:
a selector configured to select one of a plurality of operating clock signals to provide a selected clock signal, the plurality of operating clock signals being provided to a plurality of function blocks, respectively; a frequency detector configured to detect a frequency of the selected clock signal to provide a detection frequency; and an interrupt generator configured to generate an interrupt signal based on the detection frequency, the interrupt signal indicating a frequency abnormality of the operating clock signal corresponding to the selected clock signal. |
地址 |
Suwon-si, Gyeonggi-do KR |