SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING FUNCTION FOR DETECTING DEGRADATION OF SEMICONDUCTOR DEVICE AND METHOD OF DRIVING THE SAME

摘要

The present invention relates to a semiconductor integrated circuit device having the function of detecting the degradation of a semiconductor device and to a driving method thereof. The semiconductor integrated circuit device comprises: a PMOS transistor; an NMOS transistor connected to the PMOS transistor to configure an inverter; a first stress application part configured to be connected to the PMOS transistor and apply stress to the PMOS transistor; and a second stress application part configured to be connected to the NMOS transistor and apply stress to the NMOS transistor.