TEST APPARATUS FOR SURVIVABILITY EVALUATION APPARATUS OF ASIC DEVICES UNDER GAMMA RAY IRRADIATION AND TEST METHOD THEREOF

摘要

According to an embodiment of the present invention, a gamma ray survivability evaluating device of an integrated circuit element comprises: an integrated circuit element accommodating unit separated from a gamma ray source; light emitting diodes connected to a plurality of input terminals and a plurality of output terminals of the integrated circuit element accommodated in the integrated circuit element accommodating unit, respectively; and a camera configured to photograph flickering states of the light emitting diodes.