发明名称 |
Method of forming vias in silicon carbide and resulting devices and circuits |
摘要 |
A method of fabricating an integrated circuit on a silicon carbide substrate is disclosed that eliminates wire bonding that can otherwise cause undesired inductance. The method includes fabricating a semiconductor device including a Group III-V semiconductor layer on a surface on a silicon carbide substrate, wherein the semiconductor device defines at least one via through the silicon carbide substrate and the epitaxial layer. |
申请公布号 |
US9490169(B2) |
申请公布日期 |
2016.11.08 |
申请号 |
US201012917828 |
申请日期 |
2010.11.02 |
申请人 |
Cree, Inc. |
发明人 |
Ring Zoltan;Sheppard Scott Thomas;Hagleitner Helmut |
分类号 |
H01L29/12;H01L21/768;H01L29/417;H01L29/778;H01L29/812;H01L21/445;H01L29/16;H01L29/20;H01L29/45 |
主分类号 |
H01L29/12 |
代理机构 |
|
代理人 |
Josephson Anthony J. |
主权项 |
1. A semiconductor device comprising:
a silicon carbide substrate having a first surface and a polished second surface that is opposite the first surface, wherein the polished second surface renders the silicon carbide substrate substantially transparent; a semiconductor layer on said first surface of said silicon carbide substrate, wherein the semiconductor device defines at least one via through said silicon carbide substrate and said semiconductor layer; and at least one contact on the semiconductor layer opposite the silicon carbide substrate, wherein the at least one contact is coated with a noble metal. |
地址 |
Durham NC US |