发明名称 |
POWER SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide an element structure which can realize a MOS FET having a low ON resistance and a high breakdown voltage. SOLUTION: In the power semiconductor device comprising a gate electrode 11 buried in a groove via a gate insulating film, a p-type depletion region enlargement layer 4 is provided between two n-type drift layers 3 and 5, and the groove is formed to reach the n-type drift layer 3. An n-type converted region the conduction type of which is converted to an n-type is formed in a region in the vicinity of the groove of the p type depletion region enlargement layer, thus forming a carrier path. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004363498(A) |
申请公布日期 |
2004.12.24 |
申请号 |
JP20030162866 |
申请日期 |
2003.06.06 |
申请人 |
TOYOTA MOTOR CORP;DENSO CORP |
发明人 |
TAKATANI HIDESHI;HAMADA KIMIMORI;OKURA YASUTSUGU;KUROYANAGI AKIRA |
分类号 |
H01L21/336;H01L29/06;H01L29/423;H01L29/739;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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