发明名称 |
Transistor with stacked oxide semiconductor films |
摘要 |
Objects are to provide a semiconductor device for high power application in which a novel semiconductor material having high productivity is used and to provide a semiconductor device having a novel structure in which a novel semiconductor material is used. The present invention is a vertical transistor and a vertical diode each of which has a stacked body of an oxide semiconductor in which a first oxide semiconductor film having crystallinity and a second oxide semiconductor film having crystallinity are stacked. An impurity serving as an electron donor (donor) which is contained in the stacked body of an oxide semiconductor is removed in a step of crystal growth; therefore, the stacked body of an oxide semiconductor is highly purified and is an intrinsic semiconductor or a substantially intrinsic semiconductor whose carrier density is low. The stacked body of an oxide semiconductor has a wider band gap than a silicon semiconductor. |
申请公布号 |
US9368640(B2) |
申请公布日期 |
2016.06.14 |
申请号 |
US201414217988 |
申请日期 |
2014.03.18 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei |
分类号 |
H01L29/10;H01L21/00;H01L29/786;H01L33/30;H01L27/12;H01L21/02;H01L29/04;H01L29/66;H01L29/24 |
主分类号 |
H01L29/10 |
代理机构 |
Robinson Intellectual Property Law Office |
代理人 |
Robinson Intellectual Property Law Office ;Robinson Eric J. |
主权项 |
1. A semiconductor device comprising:
a transistor comprising:
a stacked body comprising:
a first oxide semiconductor film; anda second oxide semiconductor film on and in contact with the first oxide semiconductor film;a gate insulating film covering the first oxide semiconductor film and the second oxide semiconductor film; anda gate electrode over the gate insulating film and facing at least a side surface of the second oxide semiconductor film, wherein each of the first oxide semiconductor film and the second oxide semiconductor film comprises indium and zinc. |
地址 |
Kanagawa-ken JP |