发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an art of reducing thermal stress to a semiconductor element which is caused by a difference between thermal expansion coefficients of the semiconductor element and a lead frame.SOLUTION: A semiconductor device 10 includes a first lead frame 2 and a semiconductor element 6. The semiconductor element 6 is bonded to the first lead frame 2 via a first bond layer 4 composed of metal having hardness higher than that of the first lead frame 2. The first lead frame 2 has a first thin part 2a with a thickness adjusted to be thinner. One principal surface of the semiconductor element 6 is bonded to the first thin part 2a.SELECTED DRAWING: Figure 1
申请公布号 JP2016149448(A) 申请公布日期 2016.08.18
申请号 JP20150025517 申请日期 2015.02.12
申请人 TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP 发明人 SATO TOSHIICHI;USUI MASANORI;ASAI RINTARO
分类号 H01L23/50;H01L21/52 主分类号 H01L23/50
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