发明名称 |
Reactive curing process for semiconductor substrates |
摘要 |
In some embodiments, a reactive curing process may be performed by exposing a semiconductor substrate in a process chamber to an ambient containing hydrogen peroxide, with the pressure in the process chamber at about 300 Torr or less. In some embodiments, the residence time of hydrogen peroxide molecules in the process chamber is about five minutes or less. The curing process temperature may be set at about 500° C. or less. The curing process may be applied to cure flowable dielectric materials and may provide highly uniform curing results, such as across a batch of semiconductor substrates cured in a batch process chamber. |
申请公布号 |
US9431238(B2) |
申请公布日期 |
2016.08.30 |
申请号 |
US201514718517 |
申请日期 |
2015.05.21 |
申请人 |
ASM IP HOLDING B.V. |
发明人 |
Jongbloed Bert;Pierreux Dieter;van der Jeugd Cornelius A.;Terhorst Herbert;Jdira Lucian;Bankras Radko G.;Oosterlaken Theodorus G. M. |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
Knobbe, Martens, Olson & Bear LLP |
代理人 |
Knobbe, Martens, Olson & Bear LLP |
主权项 |
1. A method for semiconductor processing, comprising:
providing a plurality of semiconductor substrates in a hot wall, batch process chamber of a vertical furnace, wherein the semiconductor substrates are held in a wafer boat; exposing the semiconductor substrates in the process chamber to an ambient containing H2O2; and providing a pressure in the process chamber at about 300 Torr or below while exposing the substrate. |
地址 |
NL |