发明名称 SEMICONDUCTOR DEVICE
摘要 Semiconductor devices and fabrication methods are provided. In a semiconductor device, a semiconductor substrate includes a first electrode layer having a top surface coplanar with a top surface of the semiconductor substrate. A sacrificial layer is formed on the semiconductor substrate and the first electrode layer. A first mask layer made of a conductive material is formed on the sacrificial layer. The first mask layer and the sacrificial layer are etched until a surface of the first electrode layer is exposed to form openings through the first mask layer and the sacrificial layer. A cleaning process is performed to remove etch byproducts adhered to a surface of the first mask layer and adhered to sidewalls and bottom surfaces of the openings. Conductive plugs are formed in the openings after the cleaning process.
申请公布号 US2016322303(A1) 申请公布日期 2016.11.03
申请号 US201615210623 申请日期 2016.07.14
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 FU GUANGCAI;YANG TIANLUN;ZHANG XIAOPING
分类号 H01L23/528;H01L21/02;B81C1/00;B81B7/00;H01L29/06;H01L23/532 主分类号 H01L23/528
代理机构 代理人
主权项
地址 Shanghai CN