| 摘要 |
An in-circuit emulation debugger and method of operating an in-circuit emulation debugger to test a digital signal processor (DSP). In one embodiment, the in-circuit emulation debugger includes: (1) a device emulation unit, coupled to a collocated DSP core, for emulating circuitry that is to interact with the DSP core, (2) an external processor interface, coupled to the device emulation unit, that receives control signals from an external processor that cause the device emulation unit to provide a test environment for the DSP core and (3) a breakpoint detection circuit, associated with the device emulation unit, that responds to preprogrammed breakpoints based on occurrences of events both internal and external to the DSP core.
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