发明名称 CMP COMPOSITION FOR SILICON NITRIDE REMOVAL
摘要 The invention provides a chemical-mechanical polishing composition comprising: (a) colloidal silica particles that are surface modified with metal ions selected from Mg, Ca, Al, B, Be, and combinations thereof, and wherein the colloidal silica particles have a surface hydroxyl group density of from about 1.5 hydroxyls per nm2 to about 8 hydroxyls per nm2 of a surface area of the particles, (b) an anionic surfactant, (c) a buffering agent, and (d) water, wherein the polishing composition has a pH of about 2 to about 7, and wherein the polishing composition is substantially free of an oxidizing agent that oxidizes a metal. The invention further provides a method of chemically-mechanically polishing a substrate with the inventive chemical mechanical polishing composition. Typically, the substrate contains silicon nitride, silicon oxide, and/or polysilicon.
申请公布号 WO2016126458(A1) 申请公布日期 2016.08.11
申请号 WO2016US14858 申请日期 2016.01.26
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 HUANG, HUNG-TSUNG;YEH, MING-CHIH;TSAI, CHIH-PIN
分类号 C09K3/14 主分类号 C09K3/14
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