发明名称 MONOLITHICALLY STACKED IMAGE SENSORS
摘要 An imaging system may be formed from multiple stacked wafers. A first wafer may include backside illuminated photodiodes, floating diffusion regions, and charge transfer gate structures. The first wafer may be bonded to a second wafer that includes pixel trunk transistors such as reset transistors, source-follower transistors, row-select transistors and associated logic circuits. The pixel trunk transistors may be formed using bottom-gate thin-body transistors. The first and second wafers may share the same backend metallization layers. The second wafer may further be bonded to a third wafer that includes digital signal processing circuits. The digital signal processing circuits may also be implemented using bottom-gate thin-body transistors. Additional metallization layers may be formed over the third wafer. The first, second, and third wafers may be fabricated using the same or different technology nodes.
申请公布号 US2016358967(A1) 申请公布日期 2016.12.08
申请号 US201514729606 申请日期 2015.06.03
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 MADURAWE Raminda;RAHIM Irfan
分类号 H01L27/146;H04N5/378 主分类号 H01L27/146
代理机构 代理人
主权项 1. Imaging circuitry, comprising: a first substrate layer that includes photodiodes and floating diffusion regions; a second substrate layer that is bonded to the first substrate layer and that includes pixel transistors; and an interconnect stack formed on the second substrate layer, wherein the interconnect stack includes metal structures that are coupled to the floating diffusion regions in the first substrate layer and to the pixel transistors in the second substrate layer, and wherein the second substrate layer is interposed between the first substrate layer and the interconnect stack.
地址 Phoenix AZ US