<p>A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator- functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header.</p>
申请公布号
WO2009075469(A1)
申请公布日期
2009.06.18
申请号
WO2008KR06160
申请日期
2008.10.17
申请人
INTERNATIONAL TRADING & TECHNOLOGY CO., LTD.;CHANG, KYUNG-HUN;OH, SE-KYUNG;LEE, EUNG-SANG