发明名称 Fitting verification with in situ hearing test
摘要 A method for fitting verification of a hearing device has been disclosed. The current invention can be used to evaluate and verify a fitting for a hearing device on individual ears. It uses the hearing device itself as testing apparatus. No additional equipment is required other than the fitting computer and interface which are already required and exist for the device fitting. The method for fitting verification with in situ hearing test consists of at least two steps. One is to obtain patient's unaided hearing thresholds, which can be either in situ hearing thresholds or conventional audiogram. The second step is to measure patient's aided in situ hearing thresholds. An in situ functional gain is then calculated based on the unaided and aided in situ thresholds. The in situ functional gain can be used to evaluate or verify if intended target gains have been achieved with the device.
申请公布号 US9414173(B1) 申请公布日期 2016.08.09
申请号 US201414160657 申请日期 2014.01.22
申请人 Ototronix, LLC 发明人 Hou Zezhang
分类号 H04R29/00;H04R25/00 主分类号 H04R29/00
代理机构 Marshall & Melhorn, LLC 代理人 Marshall & Melhorn, LLC
主权项 1. A method for performing a fitting verification for a hearing device recipient using a hearing device, the method comprising the steps of: providing the hearing device in communication with a computing device; performing a first in situ hearing test using the computing device and the hearing device to obtain an unaided in situ threshold level for the hearing device recipient, wherein the hearing device is configured to have an insertion gain of about 0 dB in the normal operation mode; performing a second in situ hearing test using the computing device and the hearing device to obtain an aided in situ threshold level for the hearing device recipient; and calculating an in situ functional gain for use with verifying a setting of the hearing device using the computing device, wherein the in situ functional gain is based on the unaided in situ threshold level and the aided in situ threshold level.
地址 Houston TX US