发明名称 Encapsulated silicidation for improved SiC processing and device yield
摘要 A method for producing a silicide contact. The method comprises the steps of depositing a metal on a SiC substrate; forming an encapsulating layer on deposited metal; and annealing said deposited metal to form a suicide contact. The encapsulating layer prevents agglomeration and formation of stringers during the annealing process.
申请公布号 US2009057906(A1) 申请公布日期 2009.03.05
申请号 US20070896034 申请日期 2007.08.29
申请人 BUCHOFF STEVEN MARK;LOYD ANDREW CHRISTIAN;HOWELL ROBERT S 发明人 BUCHOFF STEVEN MARK;LOYD ANDREW CHRISTIAN;HOWELL ROBERT S.
分类号 H01L23/48;H01L21/477 主分类号 H01L23/48
代理机构 代理人
主权项
地址
您可能感兴趣的专利