发明名称 炭化珪素半導体装置およびその製造方法
摘要 This silicon carbide semiconductor device is provided with: a silicon carbide semiconductor substrate (1); a semiconductor layer (2) that is disposed on a first main surface of the silicon carbide semiconductor substrate (1); a first electrode that is provided on the semiconductor layer (2); and a second electrode that is provided on a second main surface of the silicon carbide semiconductor substrate, said second main surface being on the reverse side of the first main surface. A main current flows in the perpendicular direction with respect to the silicon carbide semiconductor substrate (1), the second electrode has a laminated structure wherein a carbon layer (92), a metal silicide layer (94), and a metal film (11) are laminated in this order from the silicon carbide semiconductor substrate side, and a plurality of pieces of carbon aggregate (95) formed of aggregated carbon are scattered in the metal silicide layer (94).
申请公布号 JP6053968(B2) 申请公布日期 2016.12.27
申请号 JP20150562693 申请日期 2014.11.12
申请人 三菱電機株式会社 发明人 須賀原 和之;末廣 善幸;中西 洋介;富永 貴亮;吉田 基;岡部 博明
分类号 H01L21/28;H01L21/329;H01L21/336;H01L29/12;H01L29/78;H01L29/861;H01L29/868;H01L29/872 主分类号 H01L21/28
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