发明名称 FINE PROTUBERANCE STRUCTURE AND METHOD OF PRODUCTION THEREOF
摘要 A method of forming a fine protuberance structure equipped with a semiconductor substrate and fine protuberances comprising a semiconductormetal solid solution, comprising arranging fine metal particles on the semiconductor substrate, forming a coating layer on those portions of the surface of the semiconductor substrate other than the arrangement positions of the fine metal particles, and heat-treating the resultant product in a vacuum atmosphere at temperatures not less than a temperature at which the constituent atoms of the semiconductor substrate and the constituent atoms of the fine metal particles undergo solid solution due to mutual diffusion at the interface. The fine protuberances are formed in such a state where a part thereof cuts into the semiconductor substrate. The fine protuberance structure will greatly contribute to the implementation of very large-scale integrated circuit devices and quantum size devices.
申请公布号 CA2311902(A1) 申请公布日期 1999.06.10
申请号 CA19982311902 申请日期 1998.11.27
申请人 JAPAN SCIENCE AND TECHNOLOGY CORPORATION;KABUSHIKI KAISHA TOSHIBA 发明人 WAKAYAMA, YUTAKA;TANAKA, SHUN-ICHIRO
分类号 H01L21/24;H01L21/28;H01L21/285;H01L21/288;H01L29/06;H01L49/00;(IPC1-7):H01L21/24 主分类号 H01L21/24
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