发明名称 |
COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR DEVICE AND METHOD OF FORMING THE SAME |
摘要 |
The present invention relates to a CMOS image sensor device and a method of forming the same. The CMOS image sensor device includes a substrate, a deep trench isolation (DTI), a photodiode, an electrode and an interface region. The DTI and the photodiode are both disposed in the substrate. The electrode is disposed on the DTI. The interface region is formed adjacent to the DTI. |
申请公布号 |
US2016204158(A1) |
申请公布日期 |
2016.07.14 |
申请号 |
US201514595167 |
申请日期 |
2015.01.12 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Hsu Chien-En;Gu Chen Jie |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
|
代理人 |
|
主权项 |
1. A complementary metal oxide semiconductor (CMOS) image sensor device, comprising:
a substrate; a deep trench isolation (DTI) disposed in the substrate; a photodiode disposed in the substrate; an electrode disposed on the DTI; an interface region adjacent to the DTI; and a doped region disposed between the DTI and the photodiode in the interface region, wherein the doped region has a different conductive type from that of the photodiode. |
地址 |
Hsin-Chu City TW |