| 摘要 |
Method and device for impedance analysis with binary excitation, with improved accuracy, where the nonidealities of the sampling and preprocessing of the response signal (including aliasing effects) are taken into account by using of the overall system model with equivalent circuit diagrams of the analyzed object and the model of the preliminary analysis of the response signal. The analysis result is the equivalent circuit diagram with component values with the best match of the overall model analysis and of the preliminary analyze of the response signal. Further, the analysis result can be the impedance frequency response or the classifier of the analyzed object. |
