APPARATUS FOR INPUTTING 3-TEST DATA INPUT TO INTEGRATED CIRCUIT IN A BOUNDARY SCAN ARCHITECTURE

摘要

a processor(10) for the boundary scanning of an integrated circuit; an IO address decoder(20) to input TDI signal to the integrated circuit by outputting IO address signal by decoding IO signal of the processor(10) according to the address signal of the processor; the first TDI signal store path-selecting part(30) selecting the path where TDI signal is stored; the first storing part(40) storing TDI signal; an oscillator(50) generating a clock; a TDI signal number-setting part(60) setting the number of the TDI signal; the second TDI signal store path-selecting part(70) outputting the selection signal to store TDI signal; and the second storing part(90) storing TDI signal of the first storing part by dividing it parallel.