SEMICONDUCTOR TEST INTERFACE AND SEMICONDUCTOR TEST APPARATUS USING THEREOF,申请号KR20050049142-传众专利搜索

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发明名称	SEMICONDUCTOR TEST INTERFACE AND SEMICONDUCTOR TEST APPARATUS USING THEREOF
摘要
申请公布号	KR100773250(B1)	申请公布日期	2007.11.05
申请号	KR20050049142	申请日期	2005.06.09
申请人		发明人
分类号	G01R1/067;G01R31/26;H01L21/66	主分类号	G01R1/067
代理机构		代理人
主权项
地址

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