发明名称 |
PARTITIONED SCAN CHAIN DIAGNOSTICS USING MULTIPLE BYPASS STRUCTURES AND INJECTION POINTS |
摘要 |
A method and apparatus are provided for isolating a defect in a scan chain comprising a plurality of components of an integrated circuit. A plurality of injection points may be positioned along the scan chain. Each injection point may be configured to introduce binary test data. A plurality of bypass structures may each be configured to selectively direct a flow of the binary test data to generate a plurality of partitioned scan paths. Test logic may be configured to execute a plurality of tests using the plurality of partitioned scan paths and to combine results of the plurality of tests to isolate a faulty component of the plurality of components. |
申请公布号 |
US2016169968(A1) |
申请公布日期 |
2016.06.16 |
申请号 |
US201414568440 |
申请日期 |
2014.12.12 |
申请人 |
International Business Machines Corporation |
发明人 |
Douskey Steven M.;Hamilton Michael J.;Kaufer Amanda R. |
分类号 |
G01R31/3177;G01R31/317 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Armonk NY US |