| 发明名称 |
Terahertz Wave Measuring Device, Measuring Method, and Measuring Rig |
| 摘要 |
There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element. |
| 申请公布号 |
US2016169735(A1) |
申请公布日期 |
2016.06.16 |
| 申请号 |
US201514965972 |
申请日期 |
2015.12.11 |
| 申请人 |
ARKRAY, Inc. |
发明人 |
Uchida Hirohisa |
| 分类号 |
G01J1/08;G01J1/02;G01J1/42 |
主分类号 |
G01J1/08 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A terahertz wave measuring device comprising:
a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size; a structural body through which the terahertz wave is transmitted; and a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element. |
| 地址 |
Kyoto JP |
