| 摘要 |
A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising:
a) a sensing surface comprising a plurality of areas of interest;b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence;c) a detector which responds differently to an intensity of light received by it at different locations; andd) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area. |
| 主权项 |
1. A system for measuring reflectivity of light from a surface exhibiting an evanescent wave phenomenon at total internal reflection, the system comprising:
a) a sample surface comprising a plurality of sensing areas of interest; b) an illumination sub-system comprising a light source, which illuminates each sensing area of interest on the sample surface over a range of angles of incidence; c) a moving detector comprising a plurality of detector elements arranged on a surface of the detector in two dimensions, which responds differently to an intensity of light received by it at different locations in two dimensions, due in part to a different response of the detector to light received by different detector elements, and in part to a different response of the detector to light received by a same detector element at different times, when the detector moves over the different locations; and d) optical elements that project light from different sensing areas of interest and different angles of incidence to the different locations in two dimensions;wherein the optical elements and the detector are configured so that it is possible to determine, from the response of the detector, how much light is reflected from each sensing area of interest, as a function of angle of incidence over the range of angles for that area, and wherein the detector achieves its full two dimensional range, resolution, or both, by scanning in time over different locations receiving light reflected at different angles of incidence, from different sensing areas of interest, or both. |
