发明名称 SUBSTRATE TREATMENT METHOD AND DEVICE, EXPOSURE METHOD AND DEVICE, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To reduce defects of a transferred pattern when exposing a substrate coated with a photosensitive material or the like to light by an immersion liquid method. <P>SOLUTION: In a resist coater 41 for applying a resist dissolved with a solvent to a substrate P, the solvent of the resist is diffused into an atmosphere in a chamber 42 where the substrate P is stored via a solvent vessel 61, a valve 62, and an air duct 44. The atmospheric pressure of the atmosphere is increased by a compressor or the like, or the temperature of the atmosphere is lowered, thus coating the substrate P with the resist in the atmosphere for suppressing the volatilization of the solvent. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007311595(A) 申请公布日期 2007.11.29
申请号 JP20060139810 申请日期 2006.05.19
申请人 NIKON CORP 发明人 NAKANO KATSUSHI
分类号 H01L21/027;G03F7/11;G03F7/16;G03F7/20 主分类号 H01L21/027
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