| 摘要 |
The invention provides a semiconductor memory device capable of performing a memory function test without using an expensive tester. When a test enable signal is inputted, a controller 21 makes first selectors 23a and 23b and a second selector 24 select respectively an internal row address signal, an internal column address signal and internal data obtained by utilizing a signal from a counter 22, and thereby writes internal data into each memory cell on the basis of the internal row address signal and the internal column address signal and thereafter reads data from each memory cell on the basis of the internal row address signal and the internal column address signal. A comparator 25 compares data read from each memory cell at the time of a data reading operation with expected value data obtained by utilizing a signal issued from the counter 22 at the time of the said read operation, and outputs the result of comparison.
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